Large area high-speed atomic force microscopy with arbitrary scan path playback: paper available now

Queensgate and the UK’s National Physical Laboratory (NPL) have developed a novel control system to enable large-area, high-speed atomic force microscopy (AFM) scans. The breakthrough was enabled following their collaboration […]

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NanoScan SP400 sample positioner on an inverted microscope

Enhance the precision of your measurements: Queensgate’s piezo sample positioners

Our NanoScan SP series of sample positioners delivers unmatched repeatability and performance for precision positioning across many imaging applications. Compatible with Prior’s XY stages, the sample positioners can be used […]

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