To address the requirement for high-speed, high-resolution scanning and nanopositioning Queensgate Instruments has developed velocity control for their nanopositioning stages. This has been applied to an XY stage and its potential for use in a high-speed atomic force microscope has been assessed using the NPL Metrological High-Speed AFM platform.
Atomic Force Microscopy (AFM) or Scanning Force Microscopy (SFM)
Read about how Queensgate achieve resolutions of fractions of a nanometer for the AFM and SFM market.
Queensgate Instruments have decades of experience providing nano positioning solutions for use in beamline science.
Software and controller integration
In this example application you can see how software has been installed into the controller, which drives the stage to deliver a solution.